R-NanoLab participated in the first session of the workshop titled “Exploring Stress and Strain in Thin Films and Semiconductor Materials,” co-organized by Roma Tre University and Sapienza University of Rome on September 12th. 
The event brought together researchers and professionals to explore the latest developments in stress management within thin films.
The session focused on the origins and control of residual stress, advanced measurement techniques, and the impact of stress on the reliability of micro-electro-mechanical systems (MEMS). It also provided an opportunity to discuss the next steps in the ongoing EU project, nanoMECommons.